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ve r 2. 3 12/03/01 1 es51 91 9 /es51920 lcr meter chipset features ? 19,999 /1,999 counts dual lcd display ? current consumption: typ. 25ma @ 100khz ? qfp - 100 l package for ES51919 ? ssop - 48l package for es51920 ? 4- wire terminal with guarding measurement ? a uto lcr smart check and measurement ? seri es/ parallel modes are selectab le ? ls/lp/cs/cp with d/q/ /e s r parameter s ? open/short calibration for ac impedance measurement is allowed: open condition requirement: impedance is larger than 9.5 m ? @ 1khz short condition requirement: impedance is less than 1 .1? ? support dcr mode 200.00 ? ~ 2 00.0m ? ? five different te st frequency are available: 100/120/1k/10k/100k hz ? test ac signal level: 0.6mv rms typ. ? 6 range resistor range used ? test range: l: 20 .0 00 h ~ 2000 h c: 20 0.0 0 pf ~ 2 0 .00 mf r: 20.000 ? ~ 200.0 m ? ? multi - level battery voltage detector ? support backlight & bu zzer sound driver ? s ource resistance depends on range min : 1 20 ? typical max : 1m ? typical application handheld lcr bridge meter description t h e chipset of es51 919/ es51920 is suitable for lcr bridge application. by using ES51919/es51920 to implement the lc r bridge meter, the complicated pcb design is not necessary. the es51920 is the analog frond end chip with resistor switches network to provide different ranges control. it also provide s a high performance integrated circuit by the signal with different fr equency to measure the complex impedance of the dut by 5 - terminals architecture . the ES51919 is the mix - mode process ing chip to handle the calculation of the d/q /esr / parameter with ls/lp/cs/cp values . it also provide s the user interface and lcd drivers to support dual display operation. to ler ance mode and relative mode are including in the dual display operation. a multiple - level battery detection and auto power - off scheme are built - in to help the improvement of battery life. the high performance of 4.5digits adc circuit design is implemented in the ES51919/es51920 chipset. a fully smart measurement for l / c / r is possible. user could measure the dut impedance simply wi thout change function key at the a uto lcr smart mode
ve r 2. 1 12/03/01 2 introduction the ES51919/es51920 chipset is a total solution for high accuracy lcr meter which could measure inductance/capacitance/resistance with secondary parameters including d issipation factor (d), q uality factor (q), p hase angle ( ), e quivalent series/parallel resistance (esr or r p) . the chipset is fully auto ranging operation for ac impedance & dc resistance measurement . because of high integrated circuit design, a smart measurement for l/c/r is poss ible (autolcr mode) . it means the user could measure the l/c/r components directly at autolcr smart mode without changing the function key . user could also select the target test frequencies of 100hz/120hz/1khz/10khz/100khz depending on dut type . component s could be measured in seri es or parallel mode according to the dut impedance automatically . t h e lcr chipset built - in a 4.5 digits adc operat es at 1.2/s updating rate nominally for l/c/r mode. the chipset operates at 0.5 /s updating rate for dcr mode. th e general dmm could measure dc resistance only, but the lcr meter could measure dc resistance and ac impedance. the impedance consists of resistance (real part) and reactance (imaginary part). for example, zs represents the impedance in seri es mode. zs can be defined a combination of resistance rs and reactance xs. it also could be defined as a |z| of magnitude with a phase angle . zs = rs + jxs | zs | real axis imaginary axis (series mode) rs xs zs 1 = rs 1 + jxs 1 xs 1 rs 1 1 > 0 1 < 0 zs = rs + jxs | zs | real axis imaginary axis (series mode) rs xs zs 1 = rs 1 + jxs 1 xs 1 rs 1 1 > 0 1 < 0 zs = rs + jxs or |zs | ?
ve r 2. 1 12/03/01 3 |z| = 2 2 xs rs + rs = |zs| cos xs = |zs| sin xs/rs = tan = tan - 1 (xs/rs) i f > 0, the reactance is inductive. in other words, if < 0, the reactance is capacitive. there are two types for reactance. the o ne is the inductive reactance x l and the other is the capacitive reactance x c . they could be defined as: ( f = sig nal frequency) x l = 2f l (l = inductance) x c = c 2 1 f (c = capacitance) measurement mode the impedance could be measured in seri es or parallel mode. the impedance z in parallel mode could be represented as reciprocal of admittance y . the admittance could be defined as y = g + jb. the g is the conductance and the b is the susceptance. rs: resistance in seri es mode rp: resistance in parallel mode xs: reactance in seri es mode xp: reactance in parallel mode cs: capacitance in seri es mode c p: capacitance in parallel mode ls: inductance in seri es mode lp: inductance in parallel mode th ere are two factors to provide the ratio of real part and imaginary part. usually the quality factor q is used for inductance measurement and the dissipation factor d is used for capacitance measurement. d factor is defined as a reciprocal of q factor. q = 1 / d = tan q = xs / rs = 2f l s / rs = 1 / 2 f cs rs q = b / g = rp / | xp | = rp / 2f l p = 2f cp rp impedance in serial mode rs jxs z = rs + jxs impedance in serial mode rs jxs z = rs + jxs admittance in parallel mode rp jxp y = 1/z = 1/rp + 1/jxp = g + jb admittance in parallel mode rp jxp y = 1/z = 1/rp + 1/jxp = g + jb
ve r 2. 1 12/03/01 4 actually, rs and rp are existed in the equivalent circuit of capacitor or inductor. if the capacitor is small, rp is more important than rs. if capacitor is la rge, the rs is more important also. therefore, use parallel mode to measure lower value capacitor and use series mode to measure higher value capacitor. for inductor, the impedance relationship is different from capacitor. if the inductor is small, r p is a lmost no effect . if inductor is large, the r s is no effect also. therefore, use series mode to measure lower value inductor and use parallel mode to measure higher value inductor. open/short c alibration the ES51919/es51920 chipset provides the open/short calibration process to get the better accuracy for high/low impedance measurement. the purpose of open/short calibration is to reduce the parasitic effect of the test fixture. z m is defined as total impedance measured to dut by the special test fixt ure which has some parasitic impedance . z m = (rs + j ls) + ( co j go + 1 || z dut ) z out is the target impedance user want s to realize. it is necessary to use the open/short calibration process to cancel the effect of rs + j ls and go+j co.
ve r 2. 1 12/03/01 5 equivalent circuit z short y open z dut z m z m C z short z dut = 1 - (z m - z short )y open z short y open z dut z m z m C z short z dut = 1 - (z m - z short )y open
ve r 2. 1 12/03/01 6 resistance di splay r ange function frequency scale range resolution r s /r p 100hz/120hz 200.00 ? 0.01 ? 100hz/120hz 2.0000k ? 0.1 ? 100hz/120hz 20.000k ? 1 ? 100hz/120hz 200.00k ? 0.01k ? 100hz/120hz 2.0000m ? 0.1k ? 100hz/120hz 20.000m ? 1k ? 100hz/120hz 200.0m ? 0.1m ? 1khz 20.000 ? 1m ? 1khz 200.00? 0.01 ? 1khz 2.0000k? 0.1 ? 1khz 20.000k ? 1 ? 1khz 200.00k ? 0.01k ? 1khz 2.0000m ? 0.1k ? 1khz 20.000m ? 1k ? 1khz 200.0m ? 0.1m ? 10khz 20.000 ? 1m ? 10khz 200.00 ? 0.01 ? 10khz 2.0000k ? 0.1 ? 10khz 20.000k ? 1 ? 10kh z 200.00k? 0.01k ? 10khz 2.0000m ? 0.1k ? 10 khz 20.00m ? 0.01m ? 100khz 20.000 ? 1m ? 100khz 200.00 ? 0.01 ? 100khz 2.0000k? 0.1 ? 100khz 20.000k ? 1 ? 100khz 200.00k ? 0.01k ? 1 0 0khz 2.000m ? 1k ?
ve r 2. 1 12/03/01 7 dc resistance display r ange function scale ran ge resolution dcr 200.00 ? 0.01 ? 2.0000k ? 0.1 ? 20.000k ? 1 ? 200.00k ? 0.01k ? 2.0000m ? 0.1k ? 20.000m ? 1k ? 200.0m ? 0.1m ? capacitance display r ange function frequency scale range resolution c s /c p 100hz/120hz 20.000nf 1 1pf 100hz/120hz 200.00nf 0.01nf 100hz/120hz 2000.0nf 0.1nf 100hz/120hz 20.000uf 1nf 100hz/120hz 200.00uf 0.01uf 100hz/120hz 2000.0uf 0.1uf 100hz/120hz 20.00mf 0.01mf 1khz 2000.0pf 0.1pf 1khz 20.000nf 1pf 1khz 200.00nf 0.01nf 1khz 2000.0nf 0.1nf 1khz 20.000uf 1n f 1khz 200.00uf 0.01uf 1khz 2000uf 1uf 10khz 200.00pf 0.01pf 10khz 2000.0pf 0.1pf 10khz 20.000nf 1pf 10khz 200.00nf 0.01nf 10khz 2000.0nf 0.1nf 10khz 20.000uf 1nf 10khz 200.0uf 0.1uf 100khz 200.00pf 0.01pf 100khz 2000.0pf 0.1pf 100k hz 20.000nf 1pf 100khz 200.00nf 0.01nf 100khz 2000.0nf 0.1nf 100khz 20.00uf 0.01uf 1 i f the counts of lcd display are less than 2000, the unit will be pf .
ve r 2. 1 12/03/01 8 inductance display r ange function frequency scale range resolution l s /l p 100hz/120hz 20.00 0mh 2 1uh 100hz/120hz 200.00mh 0.01mh 100hz/120hz 2000.0mh 0.1mh 100hz/120hz 20.000h 1mh 100hz/120hz 200.00h 0.01h 100hz/120hz 2000.0h 0.1h 100hz/120hz 20.000kh 0.001kh 1khz 2000.0uh 0.1uh 1khz 20.000mh 1uh 1khz 200.00mh 0.01mh 1khz 2000 .0mh 0.1mh 1khz 20.000h 1mh 1khz 200.00h 0.01h 1khz 2000.0h 0.1h 10khz 200.00uh 0.01uh 10khz 2000.0uh 0.1uh 10khz 20.000mh 1uh 10khz 200.00mh 0.01mh 10khz 2000.0mh 0.1mh 10khz 20.000h 1mh 100khz 20.000uh 0.001uh 100khz 200.00uh 0.01uh 100khz 2000.0uh 0.1uh 100khz 20.000mh 1uh 100khz 200.00mh 0.01mh 2 i f the counts of lcd display are less than 2000, the unit will be uh .
ve r 2. 1 12/03/01 9 accuracy (ae) vs. impedance (z dut ) @ ta =18 ~ 28 freq. / z 0.1 - 1 ? 1 C 10 ? 10 C 100k ? 100k C 1 m ? 1m C 20 ? 20 ? 2 00 m ? remark dcr 1.0%+5d 0.5%+3d 0.3%+2d 0.5%+3d 1.0%+5d 2.0%+5d d < 0.1 100/120hz 1.0%+5d 0.5%+3d 0.3%+2d 0.5%+3d 1.0%+5d 2.0%+5d 1khz 1.0%+5d 0.5%+3d 0.3%+2d 0.5%+3d 1.0%+5d 5.0%+5d 10khz 1.0%+5d 0.5%+3d 0.3%+2d 0.5%+3d 2.0%+5d n/a 100khz 2.0%+5d 1.0%+5d 0.5%+3d 1.0%+5d 2.0%+5d (1m C 2m ? ) note: all accuracy is guaranteed by proper ratio resistor calibration and open/short calibration. all accuracy is guaranteed for 10cm distance from vduth/vdutl pins of es51920. if d > 0.1 , the accuracy should be multiplied by 2 1 d + z c = 1/ 2f c if d << 0.1 in capacitance mode z l = 2f l if d << 0.1 in inductance mode sub - display parameters accuracy ae = impedance (z) accuracy definition: q = d 1 rp = esr (or rs) (1+ 2 1 d ) 1. d value accuracy de = + ae (1+d) 2. esr accuracy re= + z m ae ( ? ) ie., z m = impedance calculated by fc 2 1 or 2f l 3. phase angl e accuracy e= + (180/ ) ae (deg) 4 - terminals measurement with guard shielding the dut test leads are implemented by four terminals measurement. for achieve the accuracy shown above, it is necessary to do open/short calibration process before measurement. the test leads for dut should be as short as possible. if long extended cable is used, the guard shielding is necessary.
ve r 2. 1 12/03/01 10 es51920 package information (ssop - 48l)
ve r 2. 1 12/03/01 11 ES51919 package information (qfp - 100l)

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